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Force Modulation Microscopy :


In FMM the probe tip tracks the sample topography as in normal. In addition, a periodic signal (driving signal) mechanically drives the cantilever in the Z-direction. The amplitude of cantilever modulation that results from this applied signal varies according to the elastic properties of the sample.


Force Modulation microscopy (Atomic force microscopy mode)


The frequency of the applied signal is typically a few kilohertz which is faster than the z feedback loop is set up to track thus, topographic information can be separated from local variations in the samples elastic properties


Force Modulation Microscopy Atomic Force Microsocpy


Access this URL (http://nano-pacific.com.au/images/Mode/FMM/Catalog.zip)Catalog.zip[Force Modulation Microscopy]644 kB