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Kelvin Force Microscopy

 

* An electrostatic force between tip and sample builds up, resulting from the charge transfer.

* Kelvin Potential equals the contact potential difference (CPD) between tip and sample.

* An alternating voltage is applied in combination with bias voltage.

Kelvin Force Microscopy Atomic Force Microscopy mode

 Kelvin Force Microscopy Atomic Force Microscopy mode

 

Cantilever requirement :

* conductive coating

* force constant between 1 N/m (more sensitive to electrical forces but worse topography feedback)        and 20 N/m (less sensitive to electrical forces but better topography feedback)
   possible types : NSC18/ CrAu (made by mikromasch)

 

Possible results with an ac bias of 2V and 50% topography setpoint @ 2 V drive

Kelvin force Microscopy(Atomic force microscopy)Kelvin Force Microscopy Atomic Force Microscopy modeKelvin Force Microscopy Atomic Force MicroscopyKelvin force Microscopy(Atomic force microscopy)

The left picture shows the topography of the grating. the holes have a pitch of 2 µm and are positively doped with respect to the n-dopod substrate material.

The right image is the contact potential difference between sample and tip. its averga is -14V, but the mean difference between the n-doped and the p-doped region is only 170mV +/-10 mV.

 

 

Attachments:
Access this URL (http://nano-pacific.com.au/images/Mode/KFM/Catalog.zip)Catalog.zip[Kelvin Force Microscopy]431 kB